Comparison of Kikuchi Diffraction Geometries in Scanning Electron Microscope

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zhang, Tianbi, Berners, Lukas, Holzer, Jakub, Britton, T. Ben
Format:	Preprint
Published:	2024
Subjects:	Materials Science Instrumentation and Detectors
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2411.13018