Modeling the variability of memristive devices with hexagonal boron nitride as dielectric

Fuente: arXiv
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Bibliographic Details
Main Authors: Roldan, Juan B., Maldonado, David, Aguilera-Pedregosa, C., Alonso, F. J., Xiao, Yiping, Shen, Yaqing, Zheng, Wenwen, Yuan, Yue, Lanza, Mario
Format: Preprint
Published: 2024
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