Current-induced brightening of vacancy-related emitters in hexagonal boron nitride

Fuente: arXiv
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Auteurs principaux: Steiner, Corinne, Rahmel, Rebecca, Volmer, Frank, Windisch, Rika, Janssen, Lars H., Pesch, Patricia, Watanabe, Kenji, Taniguchi, Takashi, Libisch, Florian, Beschoten, Bernd, Stampfer, Christoph, Kurzmann, Annika
Format: Preprint
Publié: 2024
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author Steiner, Corinne
Rahmel, Rebecca
Volmer, Frank
Windisch, Rika
Janssen, Lars H.
Pesch, Patricia
Watanabe, Kenji
Taniguchi, Takashi
Libisch, Florian
Beschoten, Bernd
Stampfer, Christoph
Kurzmann, Annika
author_facet Steiner, Corinne
Rahmel, Rebecca
Volmer, Frank
Windisch, Rika
Janssen, Lars H.
Pesch, Patricia
Watanabe, Kenji
Taniguchi, Takashi
Libisch, Florian
Beschoten, Bernd
Stampfer, Christoph
Kurzmann, Annika
contents We perform photoluminescence measurements on vacancy-related emitters in hexagonal boron nitride (hBN) that are notorious for their low quantum yields. The gating of these emitters via few-layer graphene electrodes reveals a reproducible, gate-dependent brightening of the emitter, which coincides with a change in the direction of the simultaneously measured leakage current across the hBN layers. At the same time, we observe that the relative increase of the brightening effect scales linearly with the intensity of the excitation laser. Both observations can be explained in terms of a photo-assisted electroluminescence effect. Interestingly, emitters can also show the opposite behavior, i.e. a decrease in emitter intensity that depends on the gate leakage current. We explain these two opposing behaviors with different concentrations of donor and acceptor states in the hBN and show that precise control of the doping of hBN is necessary to gain control over the brightness of vacancy-related emitters by electrical means. Our findings contribute to a deeper understanding of vacancy-related defects in hBN that is necessary to make use of their potential for quantum information processing.
format Preprint
id arxiv_https___arxiv_org_abs_2411_14152
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Current-induced brightening of vacancy-related emitters in hexagonal boron nitride
Steiner, Corinne
Rahmel, Rebecca
Volmer, Frank
Windisch, Rika
Janssen, Lars H.
Pesch, Patricia
Watanabe, Kenji
Taniguchi, Takashi
Libisch, Florian
Beschoten, Bernd
Stampfer, Christoph
Kurzmann, Annika
Mesoscale and Nanoscale Physics
Materials Science
We perform photoluminescence measurements on vacancy-related emitters in hexagonal boron nitride (hBN) that are notorious for their low quantum yields. The gating of these emitters via few-layer graphene electrodes reveals a reproducible, gate-dependent brightening of the emitter, which coincides with a change in the direction of the simultaneously measured leakage current across the hBN layers. At the same time, we observe that the relative increase of the brightening effect scales linearly with the intensity of the excitation laser. Both observations can be explained in terms of a photo-assisted electroluminescence effect. Interestingly, emitters can also show the opposite behavior, i.e. a decrease in emitter intensity that depends on the gate leakage current. We explain these two opposing behaviors with different concentrations of donor and acceptor states in the hBN and show that precise control of the doping of hBN is necessary to gain control over the brightness of vacancy-related emitters by electrical means. Our findings contribute to a deeper understanding of vacancy-related defects in hBN that is necessary to make use of their potential for quantum information processing.
title Current-induced brightening of vacancy-related emitters in hexagonal boron nitride
topic Mesoscale and Nanoscale Physics
Materials Science
url https://arxiv.org/abs/2411.14152