Xiang, Z., Luo, J., & Li, S. (2024). Self-passivation reduces the Fermi level pinning in the metal-semiconductor contacts.
Chicago Style (17th ed.) CitationXiang, Ziying, Jun-Wei Luo, and Shu-Shen Li. Self-passivation Reduces the Fermi Level Pinning in the Metal-semiconductor Contacts. 2024.
MLA (9th ed.) CitationXiang, Ziying, et al. Self-passivation Reduces the Fermi Level Pinning in the Metal-semiconductor Contacts. 2024.
Warning: These citations may not always be 100% accurate.