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Parametric study of filament and gap models of resistive switching in TaO$_x$-based devices

Fuente: arXiv

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Bibliographic Details
Main Authors:	Li, Rongchen, Bai, Yang, Skowronski, Marek
Format:	Preprint
Published:	2024
Subjects:	Applied Physics Materials Science
Online Access:	Acceder al recurso
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