All Electrical Near-Zero Field Magnetoresistance Magnetometry up to 500 °C Using SiC Devices

Fuente: arXiv
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Bibliographic Details
Main Authors: Sgrignuoli, F., Viti, I., Yu, Z. G., Allridge, E., Lenahan, P., Goswami, S., Ghandi, R., Aghayan, M., Shaddock, D. M.
Format: Preprint
Published: 2024
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