APA (7th ed.) Citation

Alorda, B., Carmona, C., Torrens, G., & Bota, S. (2024). An Affordable Experimental Technique for SRAM Write Margin Characterization for Nanometer CMOS Technologies.

Chicago Style (17th ed.) Citation

Alorda, Bartomeu, Cristian Carmona, Gabriel Torrens, and Sebastia Bota. An Affordable Experimental Technique for SRAM Write Margin Characterization for Nanometer CMOS Technologies. 2024.

MLA (9th ed.) Citation

Alorda, Bartomeu, et al. An Affordable Experimental Technique for SRAM Write Margin Characterization for Nanometer CMOS Technologies. 2024.