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An Affordable Experimental Technique for SRAM Write Margin Characterization for Nanometer CMOS Technologies

Fuente: arXiv

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Dettagli Bibliografici
Autori principali:	Alorda, Bartomeu, Carmona, Cristian, Torrens, Gabriel, Bota, Sebastia
Natura:	Preprint
Pubblicazione:	2024
Soggetti:	Hardware Architecture
Accesso online:	Acceder al recurso
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