Electronic Trap Detection with Carrier-Resolved Photo-Hall Effect

Fuente: arXiv

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Bibliographic Details
Main Authors:	Gunawan, Oki, Kim, Chaeyoun, Nainggolan, Bonfilio, Lee, Minyeul, Shin, Jonghwa, Kim, Dong Suk, Jo, Yimhyun, Kim, Minjin, Euvrard, Julie, Bishop, Douglas, Libsch, Frank, Todorov, Teodor, Kim, Yunna, Shin, Byungha
Format:	Preprint
Published:	2024
Subjects:	Materials Science Applied Physics Instrumentation and Detectors
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2411.16092