You, T., Bielecki, J., & Maia, F. R. N. C. (2024). Impact of gas background on XFEL single-particle imaging.
Chicago Style (17th ed.) CitationYou, Tong, Johan Bielecki, and Filipe R. N. C. Maia. Impact of Gas Background on XFEL Single-particle Imaging. 2024.
MLA (9th ed.) CitationYou, Tong, et al. Impact of Gas Background on XFEL Single-particle Imaging. 2024.
Warning: These citations may not always be 100% accurate.