A Versatile System for Photoconductance Decay Measurement Across a Wide Range of Semiconductor Materials

Fuente: arXiv

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Bibliographic Details
Main Authors:	Bojtor, A., Krisztian, D., Parada, G., Korsos, F., Kollarics, S., Csosz, G., Markus, B. G., Forro, L., Simon, F.
Format:	Preprint
Published:	2024
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2411.16892