A Versatile System for Photoconductance Decay Measurement Across a Wide Range of Semiconductor Materials

Fuente: arXiv
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Bibliographic Details
Main Authors: Bojtor, A., Krisztian, D., Parada, G., Korsos, F., Kollarics, S., Csosz, G., Markus, B. G., Forro, L., Simon, F.
Format: Preprint
Published: 2024
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_version_ 1866914302154244096
author Bojtor, A.
Krisztian, D.
Parada, G.
Korsos, F.
Kollarics, S.
Csosz, G.
Markus, B. G.
Forro, L.
Simon, F.
author_facet Bojtor, A.
Krisztian, D.
Parada, G.
Korsos, F.
Kollarics, S.
Csosz, G.
Markus, B. G.
Forro, L.
Simon, F.
contents Time-resolved photoconductivity is widely used to characterize non-equilibrium charge-carrier lifetime, impurity content, and solar cell efficiency in a broad range of semiconductors. Most measurements are limited to the detection of reflection of electromagnetic radiation at a single frequency and a single photoexciting light wavelength. We present a time-resolved photoconductivity instrument that enables broadband frequency detection (essentially from DC to 100 GHz), temperature-dependent measurements, and multiple excitation photon energy. The measurement is realized with the help of a coplanar waveguide, which acts as an efficient antenna and whose performance was tested over 10 MHz-10 GHz. The instrument enables the study of surface and bulk charge-recombination specific processes.
format Preprint
id arxiv_https___arxiv_org_abs_2411_16892
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle A Versatile System for Photoconductance Decay Measurement Across a Wide Range of Semiconductor Materials
Bojtor, A.
Krisztian, D.
Parada, G.
Korsos, F.
Kollarics, S.
Csosz, G.
Markus, B. G.
Forro, L.
Simon, F.
Materials Science
Time-resolved photoconductivity is widely used to characterize non-equilibrium charge-carrier lifetime, impurity content, and solar cell efficiency in a broad range of semiconductors. Most measurements are limited to the detection of reflection of electromagnetic radiation at a single frequency and a single photoexciting light wavelength. We present a time-resolved photoconductivity instrument that enables broadband frequency detection (essentially from DC to 100 GHz), temperature-dependent measurements, and multiple excitation photon energy. The measurement is realized with the help of a coplanar waveguide, which acts as an efficient antenna and whose performance was tested over 10 MHz-10 GHz. The instrument enables the study of surface and bulk charge-recombination specific processes.
title A Versatile System for Photoconductance Decay Measurement Across a Wide Range of Semiconductor Materials
topic Materials Science
url https://arxiv.org/abs/2411.16892