Excitation frequency dependence of noise and minimum detectable force in amplitude-modulation atomic force microscopy

Fuente: arXiv

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Bibliographic Details
Main Authors:	Umeda, Kenichi, Kodera, Noriyuki
Format:	Preprint
Published:	2024
Subjects:	Applied Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2411.17085