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A Machine Learning Approach Capturing Hidden Parameters in Autonomous Thin-Film Deposition

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Zheng, Yuanlong, Blake, Connor, Mravac, Layla, Zhang, Fengxue, Chen, Yuxin, Yang, Shuolong
Formato:	Preprint
Publicado:	2024
Materias:	Materials Science Robotics
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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