OMNI-DC: Highly Robust Depth Completion with Multiresolution Depth Integration

Fuente: arXiv
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Main Authors: Zuo, Yiming, Yang, Willow, Ma, Zeyu, Deng, Jia
Format: Preprint
Published: 2024
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author Zuo, Yiming
Yang, Willow
Ma, Zeyu
Deng, Jia
author_facet Zuo, Yiming
Yang, Willow
Ma, Zeyu
Deng, Jia
contents Depth completion (DC) aims to predict a dense depth map from an RGB image and a sparse depth map. Existing DC methods generalize poorly to new datasets or unseen sparse depth patterns, limiting their real-world applications. We propose OMNI-DC, a highly robust DC model that generalizes well zero-shot to various datasets. The key design is a novel Multi-resolution Depth Integrator, allowing our model to deal with very sparse depth inputs. We also introduce a novel Laplacian loss to model the ambiguity in the training process. Moreover, we train OMNI-DC on a mixture of high-quality datasets with a scale normalization technique and synthetic depth patterns. Extensive experiments on 7 datasets show consistent improvements over baselines, reducing errors by as much as 43%. Codes and checkpoints are available at https://github.com/princeton-vl/OMNI-DC.
format Preprint
id arxiv_https___arxiv_org_abs_2411_19278
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle OMNI-DC: Highly Robust Depth Completion with Multiresolution Depth Integration
Zuo, Yiming
Yang, Willow
Ma, Zeyu
Deng, Jia
Computer Vision and Pattern Recognition
Depth completion (DC) aims to predict a dense depth map from an RGB image and a sparse depth map. Existing DC methods generalize poorly to new datasets or unseen sparse depth patterns, limiting their real-world applications. We propose OMNI-DC, a highly robust DC model that generalizes well zero-shot to various datasets. The key design is a novel Multi-resolution Depth Integrator, allowing our model to deal with very sparse depth inputs. We also introduce a novel Laplacian loss to model the ambiguity in the training process. Moreover, we train OMNI-DC on a mixture of high-quality datasets with a scale normalization technique and synthetic depth patterns. Extensive experiments on 7 datasets show consistent improvements over baselines, reducing errors by as much as 43%. Codes and checkpoints are available at https://github.com/princeton-vl/OMNI-DC.
title OMNI-DC: Highly Robust Depth Completion with Multiresolution Depth Integration
topic Computer Vision and Pattern Recognition
url https://arxiv.org/abs/2411.19278