Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification
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arXiv
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| Autores principales: | , , , , |
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| Formato: | Preprint |
| Publicado: |
2024
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| Acceso en línea: | |
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| _version_ | 1866916498602196992 |
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| author | Mishra, Abhishek Kumar, Suman Lingamoorthy, Anush Das, Anup Kandasamy, Nagarajan |
| author_facet | Mishra, Abhishek Kumar, Suman Lingamoorthy, Anush Das, Anup Kandasamy, Nagarajan |
| contents | In integrated circuit design, the analysis of wafer map patterns is critical to improve yield and detect manufacturing issues. We develop Wafer2Spike, an architecture for wafer map pattern classification using a spiking neural network (SNN), and demonstrate that a well-trained SNN achieves superior performance compared to deep neural network-based solutions. Wafer2Spike achieves an average classification accuracy of 98\% on the WM-811k wafer benchmark dataset. It is also superior to existing approaches for classifying defect patterns that are underrepresented in the original dataset. Wafer2Spike achieves this improved precision with great computational efficiency. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2411_19422 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification Mishra, Abhishek Kumar, Suman Lingamoorthy, Anush Das, Anup Kandasamy, Nagarajan Neural and Evolutionary Computing In integrated circuit design, the analysis of wafer map patterns is critical to improve yield and detect manufacturing issues. We develop Wafer2Spike, an architecture for wafer map pattern classification using a spiking neural network (SNN), and demonstrate that a well-trained SNN achieves superior performance compared to deep neural network-based solutions. Wafer2Spike achieves an average classification accuracy of 98\% on the WM-811k wafer benchmark dataset. It is also superior to existing approaches for classifying defect patterns that are underrepresented in the original dataset. Wafer2Spike achieves this improved precision with great computational efficiency. |
| title | Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification |
| topic | Neural and Evolutionary Computing |
| url | https://arxiv.org/abs/2411.19422 |