Fabrication and characterization of InAs nanowire-based quantum dot structures utilizing buried bottom gates

Fuente: arXiv
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Main Authors: Faustmann, Anton, Liebisch, Patrick, Bennemann, Benjamin, Perla, Pujitha, Lepsa, Mihail Ion, Pawlis, Alexander, Grützmacher, Detlev, Knoch, Joachim, Schäpers, Thomas
Format: Preprint
Published: 2024
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_version_ 1866912138006626304
author Faustmann, Anton
Liebisch, Patrick
Bennemann, Benjamin
Perla, Pujitha
Lepsa, Mihail Ion
Pawlis, Alexander
Grützmacher, Detlev
Knoch, Joachim
Schäpers, Thomas
author_facet Faustmann, Anton
Liebisch, Patrick
Bennemann, Benjamin
Perla, Pujitha
Lepsa, Mihail Ion
Pawlis, Alexander
Grützmacher, Detlev
Knoch, Joachim
Schäpers, Thomas
contents Semiconductor nanowires can be utilized to create quantum dot qubits. The formation of quantum dots is typically achieved by means of bottom gates created by a lift-off process. As an alternative, we fabricated flat buried bottom gate structures by filling etched trenches in a Si substrate with sputtered TiN, followed by mechanical polishing. This method achieved gate line pitches as small as 60 nm. The gate fingers have low gate leakage. As a proof of principle, we fabricated quantum dot devices using InAs nanowires placed on the gate fingers. These devices exhibit single electron tunneling and Coulomb blockade.
format Preprint
id arxiv_https___arxiv_org_abs_2411_19575
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Fabrication and characterization of InAs nanowire-based quantum dot structures utilizing buried bottom gates
Faustmann, Anton
Liebisch, Patrick
Bennemann, Benjamin
Perla, Pujitha
Lepsa, Mihail Ion
Pawlis, Alexander
Grützmacher, Detlev
Knoch, Joachim
Schäpers, Thomas
Mesoscale and Nanoscale Physics
Semiconductor nanowires can be utilized to create quantum dot qubits. The formation of quantum dots is typically achieved by means of bottom gates created by a lift-off process. As an alternative, we fabricated flat buried bottom gate structures by filling etched trenches in a Si substrate with sputtered TiN, followed by mechanical polishing. This method achieved gate line pitches as small as 60 nm. The gate fingers have low gate leakage. As a proof of principle, we fabricated quantum dot devices using InAs nanowires placed on the gate fingers. These devices exhibit single electron tunneling and Coulomb blockade.
title Fabrication and characterization of InAs nanowire-based quantum dot structures utilizing buried bottom gates
topic Mesoscale and Nanoscale Physics
url https://arxiv.org/abs/2411.19575