Dual Risk Minimization: Towards Next-Level Robustness in Fine-tuning Zero-Shot Models

Fuente: arXiv

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Bibliographic Details
Main Authors:	Li, Kaican, Xie, Weiyan, Huang, Yongxiang, Deng, Didan, Hong, Lanqing, Li, Zhenguo, Silva, Ricardo, Zhang, Nevin L.
Format:	Preprint
Published:	2024
Subjects:	Machine Learning Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2411.19757