Software-defined lock-in demodulator for low-frequency resistance noise measurements
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arXiv
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| Format: | Preprint |
| Published: |
2024
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| _version_ | 1866908380963012608 |
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| author | Thyzel, Tim |
| author_facet | Thyzel, Tim |
| contents | The resolution of low-frequency resistance noise measurements can be increased by amplitude modulation, shifting the spectrum of the resistance fluctuations away from the 1/f noise contributed by measurement instruments. However, commercial lock-in amplifiers used for de-modulating the fluctuations exhibit a problematic 1/f noise contribution, which imposes a hard lower limit on the relative resistance noise that can be detected. We replace the lock-in amplifier hardware by equivalent digital signal processing performed using open-source software and off-the-shelf data acquisition systems. Compared to previous implementations of the lock-in principle, our solution offers real-time preview capabilities and is resource-efficient for long acquisition times at high sampling rates. Importantly, compared to high-end commercial lock-in instruments, our system offers superior low-frequency noise performance with a reduction of the voltage power spectral density by about two orders of magnitude. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2412_00093 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Software-defined lock-in demodulator for low-frequency resistance noise measurements Thyzel, Tim Instrumentation and Detectors Other Condensed Matter The resolution of low-frequency resistance noise measurements can be increased by amplitude modulation, shifting the spectrum of the resistance fluctuations away from the 1/f noise contributed by measurement instruments. However, commercial lock-in amplifiers used for de-modulating the fluctuations exhibit a problematic 1/f noise contribution, which imposes a hard lower limit on the relative resistance noise that can be detected. We replace the lock-in amplifier hardware by equivalent digital signal processing performed using open-source software and off-the-shelf data acquisition systems. Compared to previous implementations of the lock-in principle, our solution offers real-time preview capabilities and is resource-efficient for long acquisition times at high sampling rates. Importantly, compared to high-end commercial lock-in instruments, our system offers superior low-frequency noise performance with a reduction of the voltage power spectral density by about two orders of magnitude. |
| title | Software-defined lock-in demodulator for low-frequency resistance noise measurements |
| topic | Instrumentation and Detectors Other Condensed Matter |
| url | https://arxiv.org/abs/2412.00093 |