A Unified Data Representation Learning for Non-parametric Two-sample Testing

Fuente: arXiv
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Auteurs principaux: Tian, Xunye, Peng, Liuhua, Zhou, Zhijian, Gong, Mingming, Gretton, Arthur, Liu, Feng
Format: Preprint
Publié: 2024
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author Tian, Xunye
Peng, Liuhua
Zhou, Zhijian
Gong, Mingming
Gretton, Arthur
Liu, Feng
author_facet Tian, Xunye
Peng, Liuhua
Zhou, Zhijian
Gong, Mingming
Gretton, Arthur
Liu, Feng
contents Learning effective data representations has been crucial in non-parametric two-sample testing. Common approaches will first split data into training and test sets and then learn data representations purely on the training set. However, recent theoretical studies have shown that, as long as the sample indexes are not used during the learning process, the whole data can be used to learn data representations, meanwhile ensuring control of Type-I errors. The above fact motivates us to use the test set (but without sample indexes) to facilitate the data representation learning in the testing. To this end, we propose a representation-learning two-sample testing (RL-TST) framework. RL-TST first performs purely self-supervised representation learning on the entire dataset to capture inherent representations (IRs) that reflect the underlying data manifold. A discriminative model is then trained on these IRs to learn discriminative representations (DRs), enabling the framework to leverage both the rich structural information from IRs and the discriminative power of DRs. Extensive experiments demonstrate that RL-TST outperforms representative approaches by simultaneously using data manifold information in the test set and enhancing test power via finding the DRs with the training set.
format Preprint
id arxiv_https___arxiv_org_abs_2412_00613
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle A Unified Data Representation Learning for Non-parametric Two-sample Testing
Tian, Xunye
Peng, Liuhua
Zhou, Zhijian
Gong, Mingming
Gretton, Arthur
Liu, Feng
Machine Learning
Learning effective data representations has been crucial in non-parametric two-sample testing. Common approaches will first split data into training and test sets and then learn data representations purely on the training set. However, recent theoretical studies have shown that, as long as the sample indexes are not used during the learning process, the whole data can be used to learn data representations, meanwhile ensuring control of Type-I errors. The above fact motivates us to use the test set (but without sample indexes) to facilitate the data representation learning in the testing. To this end, we propose a representation-learning two-sample testing (RL-TST) framework. RL-TST first performs purely self-supervised representation learning on the entire dataset to capture inherent representations (IRs) that reflect the underlying data manifold. A discriminative model is then trained on these IRs to learn discriminative representations (DRs), enabling the framework to leverage both the rich structural information from IRs and the discriminative power of DRs. Extensive experiments demonstrate that RL-TST outperforms representative approaches by simultaneously using data manifold information in the test set and enhancing test power via finding the DRs with the training set.
title A Unified Data Representation Learning for Non-parametric Two-sample Testing
topic Machine Learning
url https://arxiv.org/abs/2412.00613