Li, W., & Lin, C. (2024). Extension of compressive sampling to binary vector recovery for model-based defect imaging.
Chicago Style (17th ed.) CitationLi, Wei-Chen, and Chun-Yeon Lin. Extension of Compressive Sampling to Binary Vector Recovery for Model-based Defect Imaging. 2024.
MLA (9th ed.) CitationLi, Wei-Chen, and Chun-Yeon Lin. Extension of Compressive Sampling to Binary Vector Recovery for Model-based Defect Imaging. 2024.
Warning: These citations may not always be 100% accurate.