Image Forgery Localization via Guided Noise and Multi-Scale Feature Aggregation

Fuente: arXiv

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Bibliographic Details
Main Authors:	Niu, Yakun, Chen, Pei, Zhang, Lei, Tan, Lei, Chen, Yingjian
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2412.01622