OODFace: Benchmarking Robustness of Face Recognition under Common Corruptions and Appearance Variations

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Hauptverfasser: Kang, Caixin, Chen, Yubo, Ruan, Shouwei, Zhao, Shiji, Zhang, Ruochen, Wang, Jiayi, Fu, Shan, Wei, Xingxing
Format: Preprint
Veröffentlicht: 2024
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author Kang, Caixin
Chen, Yubo
Ruan, Shouwei
Zhao, Shiji
Zhang, Ruochen
Wang, Jiayi
Fu, Shan
Wei, Xingxing
author_facet Kang, Caixin
Chen, Yubo
Ruan, Shouwei
Zhao, Shiji
Zhang, Ruochen
Wang, Jiayi
Fu, Shan
Wei, Xingxing
contents With the rise of deep learning, facial recognition technology has seen extensive research and rapid development. Although facial recognition is considered a mature technology, we find that existing open-source models and commercial algorithms lack robustness in certain complex Out-of-Distribution (OOD) scenarios, raising concerns about the reliability of these systems. In this paper, we introduce OODFace, which explores the OOD challenges faced by facial recognition models from two perspectives: common corruptions and appearance variations. We systematically design 30 OOD scenarios across 9 major categories tailored for facial recognition. By simulating these challenges on public datasets, we establish three robustness benchmarks: LFW-C/V, CFP-FP-C/V, and YTF-C/V. We then conduct extensive experiments on 19 facial recognition models and 3 commercial APIs, along with extended physical experiments on face masks to assess their robustness. Next, we explore potential solutions from two perspectives: defense strategies and Vision-Language Models (VLMs). Based on the results, we draw several key insights, highlighting the vulnerability of facial recognition systems to OOD data and suggesting possible solutions. Additionally, we offer a unified toolkit that includes all corruption and variation types, easily extendable to other datasets. We hope that our benchmarks and findings can provide guidance for future improvements in facial recognition model robustness.
format Preprint
id arxiv_https___arxiv_org_abs_2412_02479
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle OODFace: Benchmarking Robustness of Face Recognition under Common Corruptions and Appearance Variations
Kang, Caixin
Chen, Yubo
Ruan, Shouwei
Zhao, Shiji
Zhang, Ruochen
Wang, Jiayi
Fu, Shan
Wei, Xingxing
Computer Vision and Pattern Recognition
Artificial Intelligence
Cryptography and Security
Machine Learning
With the rise of deep learning, facial recognition technology has seen extensive research and rapid development. Although facial recognition is considered a mature technology, we find that existing open-source models and commercial algorithms lack robustness in certain complex Out-of-Distribution (OOD) scenarios, raising concerns about the reliability of these systems. In this paper, we introduce OODFace, which explores the OOD challenges faced by facial recognition models from two perspectives: common corruptions and appearance variations. We systematically design 30 OOD scenarios across 9 major categories tailored for facial recognition. By simulating these challenges on public datasets, we establish three robustness benchmarks: LFW-C/V, CFP-FP-C/V, and YTF-C/V. We then conduct extensive experiments on 19 facial recognition models and 3 commercial APIs, along with extended physical experiments on face masks to assess their robustness. Next, we explore potential solutions from two perspectives: defense strategies and Vision-Language Models (VLMs). Based on the results, we draw several key insights, highlighting the vulnerability of facial recognition systems to OOD data and suggesting possible solutions. Additionally, we offer a unified toolkit that includes all corruption and variation types, easily extendable to other datasets. We hope that our benchmarks and findings can provide guidance for future improvements in facial recognition model robustness.
title OODFace: Benchmarking Robustness of Face Recognition under Common Corruptions and Appearance Variations
topic Computer Vision and Pattern Recognition
Artificial Intelligence
Cryptography and Security
Machine Learning
url https://arxiv.org/abs/2412.02479