Revisiting Energy-Based Model for Out-of-Distribution Detection

Fuente: arXiv
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Main Authors: Wu, Yifan, Ye, Xichen, Dai, Songmin, Pan, Dengye, Li, Xiaoqiang, Zhang, Weizhong, Chen, Yifan
Format: Preprint
Published: 2024
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_version_ 1866913596889366528
author Wu, Yifan
Ye, Xichen
Dai, Songmin
Pan, Dengye
Li, Xiaoqiang
Zhang, Weizhong
Chen, Yifan
author_facet Wu, Yifan
Ye, Xichen
Dai, Songmin
Pan, Dengye
Li, Xiaoqiang
Zhang, Weizhong
Chen, Yifan
contents Out-of-distribution (OOD) detection is an essential approach to robustifying deep learning models, enabling them to identify inputs that fall outside of their trained distribution. Existing OOD detection methods usually depend on crafted data, such as specific outlier datasets or elaborate data augmentations. While this is reasonable, the frequent mismatch between crafted data and OOD data limits model robustness and generalizability. In response to this issue, we introduce Outlier Exposure by Simple Transformations (OEST), a framework that enhances OOD detection by leveraging "peripheral-distribution" (PD) data. Specifically, PD data are samples generated through simple data transformations, thus providing an efficient alternative to manually curated outliers. We adopt energy-based models (EBMs) to study PD data. We recognize the "energy barrier" in OOD detection, which characterizes the energy difference between in-distribution (ID) and OOD samples and eases detection. PD data are introduced to establish the energy barrier during training. Furthermore, this energy barrier concept motivates a theoretically grounded energy-barrier loss to replace the classical energy-bounded loss, leading to an improved paradigm, OEST*, which achieves a more effective and theoretically sound separation between ID and OOD samples. We perform empirical validation of our proposal, and extensive experiments across various benchmarks demonstrate that OEST* achieves better or similar accuracy compared with state-of-the-art methods.
format Preprint
id arxiv_https___arxiv_org_abs_2412_03058
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Revisiting Energy-Based Model for Out-of-Distribution Detection
Wu, Yifan
Ye, Xichen
Dai, Songmin
Pan, Dengye
Li, Xiaoqiang
Zhang, Weizhong
Chen, Yifan
Computer Vision and Pattern Recognition
68T05, 68T45
I.2.10; I.5.1
Out-of-distribution (OOD) detection is an essential approach to robustifying deep learning models, enabling them to identify inputs that fall outside of their trained distribution. Existing OOD detection methods usually depend on crafted data, such as specific outlier datasets or elaborate data augmentations. While this is reasonable, the frequent mismatch between crafted data and OOD data limits model robustness and generalizability. In response to this issue, we introduce Outlier Exposure by Simple Transformations (OEST), a framework that enhances OOD detection by leveraging "peripheral-distribution" (PD) data. Specifically, PD data are samples generated through simple data transformations, thus providing an efficient alternative to manually curated outliers. We adopt energy-based models (EBMs) to study PD data. We recognize the "energy barrier" in OOD detection, which characterizes the energy difference between in-distribution (ID) and OOD samples and eases detection. PD data are introduced to establish the energy barrier during training. Furthermore, this energy barrier concept motivates a theoretically grounded energy-barrier loss to replace the classical energy-bounded loss, leading to an improved paradigm, OEST*, which achieves a more effective and theoretically sound separation between ID and OOD samples. We perform empirical validation of our proposal, and extensive experiments across various benchmarks demonstrate that OEST* achieves better or similar accuracy compared with state-of-the-art methods.
title Revisiting Energy-Based Model for Out-of-Distribution Detection
topic Computer Vision and Pattern Recognition
68T05, 68T45
I.2.10; I.5.1
url https://arxiv.org/abs/2412.03058