Critical assessment of contact resistance and mobility in tin perovskite semiconductors

Fuente: arXiv
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Bibliographic Details
Main Authors: Zhang, Youcheng, Pecorario, Stefano, Chua, Xian Wei, Ren, Xinglong, Zhao, Cong, Mazlumian, Rozana, Senanayak, Satyaprasad P., Dey, Krishanu, Stranks, Sam, Sirringhaus, Henning
Format: Preprint
Published: 2024
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