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Temperature-induced hysteretic behavior of resistivity and magnetoresistance of electrodeposited bismuth films for X- ray transition-edge sensor absorbers

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Quaranta, Orlando, Coppola, Nunzia, Gades, Lisa, Galdi, Alice, Guruswamy, Tejas, Mauro, Alessandro, Maritato, Luigi, Miceli, Antonino, Pagano, Sergio, Barone, Carlo
Formato:	Preprint
Publicado:	2024
Materias:	Instrumentation and Detectors
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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