Stoichiometry and Thickness of Epitaxial SrTiO$_{3}$ on Silicon (001): an Investigation of Physical, Optical and Electrical Properties

Fuente: arXiv
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Bibliographic Details
Main Authors: Boelen, Andries, Baryshnikova, Marina, Ulrich, Anja, Brahim, Kamal, Van de Vondel, Joris, Haffner, Christian, Merckling, Clement
Format: Preprint
Published: 2024
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