Testbeam Characterization of a SiGe BiCMOS Monolithic Silicon Pixel Detector with Internal Gain Layer

Fuente: arXiv

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Bibliographic Details
Main Authors:	Paolozzi, L., Milanesio, M., Moretti, T., Cardella, R., Kugathasan, T., Picardi, A., Elviretti, M., Rücker, H., Cadoux, F., Cardarelli, R., Cecconi, L., Débieux, S., Favre, Y., Fenoglio, C. A., Ferrere, D., Gonzalez-Sevilla, S., Iodice, L., Kotitsa, R., Magliocca, C., Nessi, M., Pizarro-Medina, A., Saidi, J., Pinto, M. Vicente Barreto, Zambito, S., Iacobucci, G.
Format:	Preprint
Published:	2024
Subjects:	Instrumentation and Detectors
Online Access:	Acceder al recurso
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