Breaking the Bias: Recalibrating the Attention of Industrial Anomaly Detection

Fuente: arXiv
Enregistré dans:
Détails bibliographiques
Auteurs principaux: Chen, Xin, Cao, Liujuan, Zhang, Shengchuan, Zheng, Xiewu, Zhang, Yan
Format: Preprint
Publié: 2024
Sujets:
Accès en ligne:
Tags: Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!
_version_ 1866929624605261824
author Chen, Xin
Cao, Liujuan
Zhang, Shengchuan
Zheng, Xiewu
Zhang, Yan
author_facet Chen, Xin
Cao, Liujuan
Zhang, Shengchuan
Zheng, Xiewu
Zhang, Yan
contents Due to the scarcity and unpredictable nature of defect samples, industrial anomaly detection (IAD) predominantly employs unsupervised learning. However, all unsupervised IAD methods face a common challenge: the inherent bias in normal samples, which causes models to focus on variable regions while overlooking potential defects in invariant areas. To effectively overcome this, it is essential to decompose and recalibrate attention, guiding the model to suppress irrelevant variations and concentrate on subtle, defect-susceptible areas. In this paper, we propose Recalibrating Attention of Industrial Anomaly Detection (RAAD), a framework that systematically decomposes and recalibrates attention maps. RAAD employs a two-stage process: first, it reduces attention bias through quantization, and second, it fine-tunes defect-prone regions for improved sensitivity. Central to this framework is Hierarchical Quantization Scoring (HQS), which dynamically allocates bit-widths across layers based on their anomaly detection contributions. HQS dynamically adjusts bit-widths based on the hierarchical nature of attention maps, compressing lower layers that produce coarse and noisy attention while preserving deeper layers with sharper, defect-focused attention. This approach optimizes both computational efficiency and the model' s sensitivity to anomalies. We validate the effectiveness of RAAD on 32 datasets using a single 3090ti. Experiments demonstrate that RAAD, balances the complexity and expressive power of the model, enhancing its anomaly detection capability.
format Preprint
id arxiv_https___arxiv_org_abs_2412_08189
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Breaking the Bias: Recalibrating the Attention of Industrial Anomaly Detection
Chen, Xin
Cao, Liujuan
Zhang, Shengchuan
Zheng, Xiewu
Zhang, Yan
Computer Vision and Pattern Recognition
Due to the scarcity and unpredictable nature of defect samples, industrial anomaly detection (IAD) predominantly employs unsupervised learning. However, all unsupervised IAD methods face a common challenge: the inherent bias in normal samples, which causes models to focus on variable regions while overlooking potential defects in invariant areas. To effectively overcome this, it is essential to decompose and recalibrate attention, guiding the model to suppress irrelevant variations and concentrate on subtle, defect-susceptible areas. In this paper, we propose Recalibrating Attention of Industrial Anomaly Detection (RAAD), a framework that systematically decomposes and recalibrates attention maps. RAAD employs a two-stage process: first, it reduces attention bias through quantization, and second, it fine-tunes defect-prone regions for improved sensitivity. Central to this framework is Hierarchical Quantization Scoring (HQS), which dynamically allocates bit-widths across layers based on their anomaly detection contributions. HQS dynamically adjusts bit-widths based on the hierarchical nature of attention maps, compressing lower layers that produce coarse and noisy attention while preserving deeper layers with sharper, defect-focused attention. This approach optimizes both computational efficiency and the model' s sensitivity to anomalies. We validate the effectiveness of RAAD on 32 datasets using a single 3090ti. Experiments demonstrate that RAAD, balances the complexity and expressive power of the model, enhancing its anomaly detection capability.
title Breaking the Bias: Recalibrating the Attention of Industrial Anomaly Detection
topic Computer Vision and Pattern Recognition
url https://arxiv.org/abs/2412.08189