Common-Mode Control and Confinement Inversion of Electrostatically Defined Quantum Dots in a Commercial CMOS Process

Fuente: arXiv
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Autores principales: Sokolov, Andrii, Wu, Xutong, Power, Conor, Asker, Mike, Giounanlis, Panagiotis, Kriekouki, Ioanna, Hanos-Puskai, Peter, McGeough, Conor, Bashir, Imran, Redmond, David, Leipold, Dirk, Staszewski, Bogdan, Blokhina, Elena
Formato: Preprint
Publicado: 2024
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author Sokolov, Andrii
Wu, Xutong
Power, Conor
Asker, Mike
Giounanlis, Panagiotis
Kriekouki, Ioanna
Hanos-Puskai, Peter
McGeough, Conor
Bashir, Imran
Redmond, David
Leipold, Dirk
Staszewski, Bogdan
Blokhina, Elena
author_facet Sokolov, Andrii
Wu, Xutong
Power, Conor
Asker, Mike
Giounanlis, Panagiotis
Kriekouki, Ioanna
Hanos-Puskai, Peter
McGeough, Conor
Bashir, Imran
Redmond, David
Leipold, Dirk
Staszewski, Bogdan
Blokhina, Elena
contents Confining electrons or holes in quantum dots formed in the channel of industry-standard fully depleted silicon-on-insulator CMOS structures is a promising approach to scalable qubit architectures. In this article, we present our results on a calibrated model of a commercial nanostructure using the simulation tool Quantum TCAD, along with our experimental verification of all model predictions. We demonstrate here that quantum dots can be formed in the device channel by applying a combination of a common-mode voltage to the source and drain and a back gate voltage. Moreover, in this approach, the amount of quantum dots can be controlled and modified. Also, we report our results on an effective detuning of the energy levels in the quantum dots by varying the barrier gate voltages. Given the need and importance of scaling to larger numbers of qubits, we demonstrate here the feasibility of simulating and improving the design of quantum dot devices before their fabrication based on a commercial process.
format Preprint
id arxiv_https___arxiv_org_abs_2412_08302
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Common-Mode Control and Confinement Inversion of Electrostatically Defined Quantum Dots in a Commercial CMOS Process
Sokolov, Andrii
Wu, Xutong
Power, Conor
Asker, Mike
Giounanlis, Panagiotis
Kriekouki, Ioanna
Hanos-Puskai, Peter
McGeough, Conor
Bashir, Imran
Redmond, David
Leipold, Dirk
Staszewski, Bogdan
Blokhina, Elena
Mesoscale and Nanoscale Physics
Confining electrons or holes in quantum dots formed in the channel of industry-standard fully depleted silicon-on-insulator CMOS structures is a promising approach to scalable qubit architectures. In this article, we present our results on a calibrated model of a commercial nanostructure using the simulation tool Quantum TCAD, along with our experimental verification of all model predictions. We demonstrate here that quantum dots can be formed in the device channel by applying a combination of a common-mode voltage to the source and drain and a back gate voltage. Moreover, in this approach, the amount of quantum dots can be controlled and modified. Also, we report our results on an effective detuning of the energy levels in the quantum dots by varying the barrier gate voltages. Given the need and importance of scaling to larger numbers of qubits, we demonstrate here the feasibility of simulating and improving the design of quantum dot devices before their fabrication based on a commercial process.
title Common-Mode Control and Confinement Inversion of Electrostatically Defined Quantum Dots in a Commercial CMOS Process
topic Mesoscale and Nanoscale Physics
url https://arxiv.org/abs/2412.08302