Defect density of states of tin oxide and copper oxide p-type thin-film transistors

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Mattsson, Måns J., Niang, Kham M., Parker, Jared, Meeth, David J., Wager, John F., Flewitt, Andrew J., Graham, Matt W.
Format:	Preprint
Published:	2024
Subjects:	Materials Science Mesoscale and Nanoscale Physics Applied Physics
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

https://arxiv.org/abs/2412.09533