Probing Millicharged Particles at an Electron Beam Dump with Ultralow-Threshold Sensors

Fuente: arXiv
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Bibliographic Details
Main Authors: Essig, Rouven, Li, Peiran, Liu, Zhen, McDuffie, Megan, Plestid, Ryan, Xu, Hailin
Format: Preprint
Published: 2024
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