Carrier localization in defected areas of (Cd, Mn)Te quantum well investigated via Optically Detected Magnetic Resonance employed in the microscale

Fuente: arXiv
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Autori principali: Dydniański, Amadeusz, Łopion, Aleksandra, Raczyński, Mateusz, Kazimierczuk, Tomasz, Połczyńska, Karolina Ewa, Pacuski, Wojciech, Kossacki, Piotr
Natura: Preprint
Pubblicazione: 2024
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author Dydniański, Amadeusz
Łopion, Aleksandra
Raczyński, Mateusz
Kazimierczuk, Tomasz
Połczyńska, Karolina Ewa
Pacuski, Wojciech
Kossacki, Piotr
author_facet Dydniański, Amadeusz
Łopion, Aleksandra
Raczyński, Mateusz
Kazimierczuk, Tomasz
Połczyńska, Karolina Ewa
Pacuski, Wojciech
Kossacki, Piotr
contents In this work, we study the impact of carrier localization on three quantities sensitive to carrier gas density at the micrometer scale: charged exciton (X+) oscillator strength, local free carrier conductivity, and the Knight shift. The last two are observed in a micrometer-scale, spatially resolved optically detected magnetic resonance experiment (ODMR). On the surface of MBE-grown (Cd,Mn)Te quantum well we identify defected areas in the vicinity of dislocations. We find that these areas show a much lower conductivity signal while maintaining the same Knight shift values as the pristine areas of the quantum well. We attribute this behavior to carrier localization in the defected regions.
format Preprint
id arxiv_https___arxiv_org_abs_2412_10075
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Carrier localization in defected areas of (Cd, Mn)Te quantum well investigated via Optically Detected Magnetic Resonance employed in the microscale
Dydniański, Amadeusz
Łopion, Aleksandra
Raczyński, Mateusz
Kazimierczuk, Tomasz
Połczyńska, Karolina Ewa
Pacuski, Wojciech
Kossacki, Piotr
Mesoscale and Nanoscale Physics
Materials Science
In this work, we study the impact of carrier localization on three quantities sensitive to carrier gas density at the micrometer scale: charged exciton (X+) oscillator strength, local free carrier conductivity, and the Knight shift. The last two are observed in a micrometer-scale, spatially resolved optically detected magnetic resonance experiment (ODMR). On the surface of MBE-grown (Cd,Mn)Te quantum well we identify defected areas in the vicinity of dislocations. We find that these areas show a much lower conductivity signal while maintaining the same Knight shift values as the pristine areas of the quantum well. We attribute this behavior to carrier localization in the defected regions.
title Carrier localization in defected areas of (Cd, Mn)Te quantum well investigated via Optically Detected Magnetic Resonance employed in the microscale
topic Mesoscale and Nanoscale Physics
Materials Science
url https://arxiv.org/abs/2412.10075