SEW: Self-calibration Enhanced Whole Slide Pathology Image Analysis

Fuente: arXiv

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Bibliographic Details
Main Authors:	Luo, Haoming, Yu, Xiaotian, Zhang, Shengxuming, Xia, Jiabin, Jian, Yang, Sun, Yuning, Xue, Liang, Song, Mingli, Zhang, Jing, Zhang, Xiuming, Feng, Zunlei
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2412.10853