Investigating the Effect of Electrical and Thermal Transport Properties on Oxide-Based Memristors Performance and Reliability

Fuente: arXiv

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Bibliographic Details
Main Authors:	Gooran-Shoorakchaly, Armin, Sharif, Sarah, Banad, Yaser
Format:	Preprint
Published:	2024
Subjects:	Emerging Technologies Hardware Architecture Applied Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2412.12450