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| Main Authors: | , , , , |
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| Format: | Preprint |
| Published: |
2024
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2412.13142 |
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Table of Contents:
- Atomic resolution STEM images often suffer from noise due to low electron doses and instrument imperfections, hence it is challenging to obtain critical structural details required for material analysis. To address the problem, we propose a Physics-Informed Neural Network (PINN) framework for denoising STEM images. Our method integrates spectral fidelity, total variation, and brightness/contrast consistency losses to ensure the preservation of fine structures, smooth regions, and physical signal intensities, maintaining the structural integrity of the denoised images. Our proposed method effectively balances noise reduction with the preservation of atomic resolution details and complements existing methods, seeking to enhance the utility of STEM images in material characterization and analysis.