Detecting Dark Patterns in User Interfaces Using Logistic Regression and Bag-of-Words Representation

Fuente: arXiv
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Bibliographic Details
Main Authors: Umar, Aliyu, Lawan, Maaruf, Lawan, Adamu, Abdulkadir, Abdullahi, Dahiru, Mukhtar
Format: Preprint
Published: 2024
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