Artificial Neural Network based Modelling for Variational Effect on Double Metal Double Gate Negative Capacitance FET

Fuente: arXiv

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Bibliographic Details
Main Authors:	Pathak, Yash, Goswami, Laxman Prasad, Malhotra, Bansi Dhar, Chaujar, Rishu
Format:	Preprint
Published:	2024
Subjects:	Materials Science Applied Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2412.14216