Long-term stability of scientific X-ray CMOS detectors
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arXiv
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| Autori principali: | , , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2024
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| _version_ | 1866909434217758720 |
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| author | Liu, Mingjun Wu, Qinyu Ling, Zhixing Zhang, Chen Yuan, Weimin Zhang, Shuang-Nan |
| author_facet | Liu, Mingjun Wu, Qinyu Ling, Zhixing Zhang, Chen Yuan, Weimin Zhang, Shuang-Nan |
| contents | In recent years, complementary metal-oxide-semiconductor (CMOS) sensors have been demonstrated to have significant potential in X-ray astronomy, where long-term reliability is crucial for space X-ray telescopes. This study examines the long-term stability of a scientific CMOS sensor, focusing on its bias, dark current, readout noise, and X-ray spectral performance. The sensor was initially tested at -30 $^\circ$C for 16 months, followed by accelerated aging at 20 $^\circ$C. After a total aging period of 610 days, the bias map, dark current, readout noise, gain, and energy resolution exhibited no observable degradation. There are less than 50 pixels within the 4 k $\times$ 4 k array which show a decrease of the bias under 50 ms integration time by over 10 digital numbers (DNs). First-order kinetic fitting of the gain evolution predicts a gain degeneration of 0.73% over 3 years and 2.41% over 10 years. These results underscore the long-term reliability of CMOS sensors for application in space missions. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2412_14850 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Long-term stability of scientific X-ray CMOS detectors Liu, Mingjun Wu, Qinyu Ling, Zhixing Zhang, Chen Yuan, Weimin Zhang, Shuang-Nan Instrumentation and Methods for Astrophysics High Energy Astrophysical Phenomena Instrumentation and Detectors In recent years, complementary metal-oxide-semiconductor (CMOS) sensors have been demonstrated to have significant potential in X-ray astronomy, where long-term reliability is crucial for space X-ray telescopes. This study examines the long-term stability of a scientific CMOS sensor, focusing on its bias, dark current, readout noise, and X-ray spectral performance. The sensor was initially tested at -30 $^\circ$C for 16 months, followed by accelerated aging at 20 $^\circ$C. After a total aging period of 610 days, the bias map, dark current, readout noise, gain, and energy resolution exhibited no observable degradation. There are less than 50 pixels within the 4 k $\times$ 4 k array which show a decrease of the bias under 50 ms integration time by over 10 digital numbers (DNs). First-order kinetic fitting of the gain evolution predicts a gain degeneration of 0.73% over 3 years and 2.41% over 10 years. These results underscore the long-term reliability of CMOS sensors for application in space missions. |
| title | Long-term stability of scientific X-ray CMOS detectors |
| topic | Instrumentation and Methods for Astrophysics High Energy Astrophysical Phenomena Instrumentation and Detectors |
| url | https://arxiv.org/abs/2412.14850 |