Switching Frequency as FPGA Monitor: Studying Degradation and Ageing Prognosis at Large Scale

Fuente: arXiv
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Bibliographic Details
Main Authors: Lanzieri, Leandro, Butkowski, Lukasz, Kral, Jiri, Fey, Goerschwin, Schlarb, Holger, Schmidt, Thomas C.
Format: Preprint
Published: 2024
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