Atomic resolution imaging of the strength and 3D direction of atomic displacements in functional oxide thin films

Fuente: arXiv

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Bibliographic Details
Main Authors:	MacLaren, Ian, Silinga, Aurys, Barthel, Juri, Kleibeuker, Josee, MacManus-Driscoll, Judith L, Allen, Christopher S, Kirkland, Angus I
Format:	Preprint
Published:	2024
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2412.16297