MVREC: A General Few-shot Defect Classification Model Using Multi-View Region-Context

Fuente: arXiv

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Bibliographic Details
Main Authors:	Lyu, Shuai, Zhang, Rongchen, Ma, Zeqi, Liao, Fangjian, Mo, Dongmei, Wong, Waikeung
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2412.16897