MVREC: A General Few-shot Defect Classification Model Using Multi-View Region-Context
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arXiv
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| Autori principali: | , , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2024
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| _version_ | 1866913765086199808 |
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| author | Lyu, Shuai Zhang, Rongchen Ma, Zeqi Liao, Fangjian Mo, Dongmei Wong, Waikeung |
| author_facet | Lyu, Shuai Zhang, Rongchen Ma, Zeqi Liao, Fangjian Mo, Dongmei Wong, Waikeung |
| contents | Few-shot defect multi-classification (FSDMC) is an emerging trend in quality control within industrial manufacturing. However, current FSDMC research often lacks generalizability due to its focus on specific datasets. Additionally, defect classification heavily relies on contextual information within images, and existing methods fall short of effectively extracting this information. To address these challenges, we propose a general FSDMC framework called MVREC, which offers two primary advantages: (1) MVREC extracts general features for defect instances by incorporating the pre-trained AlphaCLIP model. (2) It utilizes a region-context framework to enhance defect features by leveraging mask region input and multi-view context augmentation. Furthermore, Few-shot Zip-Adapter(-F) classifiers within the model are introduced to cache the visual features of the support set and perform few-shot classification. We also introduce MVTec-FS, a new FSDMC benchmark based on MVTec AD, which includes 1228 defect images with instance-level mask annotations and 46 defect types. Extensive experiments conducted on MVTec-FS and four additional datasets demonstrate its effectiveness in general defect classification and its ability to incorporate contextual information to improve classification performance. Code: https://github.com/ShuaiLYU/MVREC |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2412_16897 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | MVREC: A General Few-shot Defect Classification Model Using Multi-View Region-Context Lyu, Shuai Zhang, Rongchen Ma, Zeqi Liao, Fangjian Mo, Dongmei Wong, Waikeung Computer Vision and Pattern Recognition Artificial Intelligence Few-shot defect multi-classification (FSDMC) is an emerging trend in quality control within industrial manufacturing. However, current FSDMC research often lacks generalizability due to its focus on specific datasets. Additionally, defect classification heavily relies on contextual information within images, and existing methods fall short of effectively extracting this information. To address these challenges, we propose a general FSDMC framework called MVREC, which offers two primary advantages: (1) MVREC extracts general features for defect instances by incorporating the pre-trained AlphaCLIP model. (2) It utilizes a region-context framework to enhance defect features by leveraging mask region input and multi-view context augmentation. Furthermore, Few-shot Zip-Adapter(-F) classifiers within the model are introduced to cache the visual features of the support set and perform few-shot classification. We also introduce MVTec-FS, a new FSDMC benchmark based on MVTec AD, which includes 1228 defect images with instance-level mask annotations and 46 defect types. Extensive experiments conducted on MVTec-FS and four additional datasets demonstrate its effectiveness in general defect classification and its ability to incorporate contextual information to improve classification performance. Code: https://github.com/ShuaiLYU/MVREC |
| title | MVREC: A General Few-shot Defect Classification Model Using Multi-View Region-Context |
| topic | Computer Vision and Pattern Recognition Artificial Intelligence |
| url | https://arxiv.org/abs/2412.16897 |