Detecting and Classifying Defective Products in Images Using YOLO
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arXiv
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| Main Authors: | , , , , , |
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| Format: | Preprint |
| Published: |
2024
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| _version_ | 1866913622903488512 |
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| author | Qi, Zhen Ding, Liwei Li, Xiangtian Hu, Jiacheng Lyu, Bin Xiang, Ao |
| author_facet | Qi, Zhen Ding, Liwei Li, Xiangtian Hu, Jiacheng Lyu, Bin Xiang, Ao |
| contents | With the continuous advancement of industrial automation, product quality inspection has become increasingly important in the manufacturing process. Traditional inspection methods, which often rely on manual checks or simple machine vision techniques, suffer from low efficiency and insufficient accuracy. In recent years, deep learning technology, especially the YOLO (You Only Look Once) algorithm, has emerged as a prominent solution in the field of product defect detection due to its efficient real-time detection capabilities and excellent classification performance. This study aims to use the YOLO algorithm to detect and classify defects in product images. By constructing and training a YOLO model, we conducted experiments on multiple industrial product datasets. The results demonstrate that this method can achieve real-time detection while maintaining high detection accuracy, significantly improving the efficiency and accuracy of product quality inspection. This paper further analyzes the advantages and limitations of the YOLO algorithm in practical applications and explores future research directions. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2412_16935 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Detecting and Classifying Defective Products in Images Using YOLO Qi, Zhen Ding, Liwei Li, Xiangtian Hu, Jiacheng Lyu, Bin Xiang, Ao Computer Vision and Pattern Recognition With the continuous advancement of industrial automation, product quality inspection has become increasingly important in the manufacturing process. Traditional inspection methods, which often rely on manual checks or simple machine vision techniques, suffer from low efficiency and insufficient accuracy. In recent years, deep learning technology, especially the YOLO (You Only Look Once) algorithm, has emerged as a prominent solution in the field of product defect detection due to its efficient real-time detection capabilities and excellent classification performance. This study aims to use the YOLO algorithm to detect and classify defects in product images. By constructing and training a YOLO model, we conducted experiments on multiple industrial product datasets. The results demonstrate that this method can achieve real-time detection while maintaining high detection accuracy, significantly improving the efficiency and accuracy of product quality inspection. This paper further analyzes the advantages and limitations of the YOLO algorithm in practical applications and explores future research directions. |
| title | Detecting and Classifying Defective Products in Images Using YOLO |
| topic | Computer Vision and Pattern Recognition |
| url | https://arxiv.org/abs/2412.16935 |