A 3-dimensional scanning trapped-ion probe

Fuente: arXiv
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Main Authors: Sägesser, Tobias, Jain, Shreyans, Hrmo, Pavel, Ferk, Alexander, Simoni, Matteo, Cui, Yingying, Mordini, Carmelo, Kienzler, Daniel, Home, Jonathan
Format: Preprint
Published: 2024
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author Sägesser, Tobias
Jain, Shreyans
Hrmo, Pavel
Ferk, Alexander
Simoni, Matteo
Cui, Yingying
Mordini, Carmelo
Kienzler, Daniel
Home, Jonathan
author_facet Sägesser, Tobias
Jain, Shreyans
Hrmo, Pavel
Ferk, Alexander
Simoni, Matteo
Cui, Yingying
Mordini, Carmelo
Kienzler, Daniel
Home, Jonathan
contents Single-atom quantum sensors offer high spatial resolution and high sensitivity to electric and magnetic fields. Among them, trapped ions offer exceptional performance in sensing electric fields, which has been used in particular to probe these in the proximity of metallic surfaces. However, the flexibility of previous work was limited by the use of radio-frequency trapping fields, which has restricted spatial scanning to linear translations, and calls into question whether observed phenomena are connected to the presence of the radio-frequency fields. Here, using a Penning trap instead, we demonstrate a single ion probe which offers three-dimensional position scanning at distances between $50$ $μ\mathrm{m}$ and $450$ $μ\mathrm{m}$ from a metallic surface and above a $200\times200$ $μ\mathrm{m}^{2}$ area, allowing us to reconstruct static and time-varying electric as well as magnetic fields. We use this to map charge distributions on the metallic surface and noise stemming from it. The methods demonstrated here allow similar probing to be carried out on samples with a variety of materials, surface constitutions and geometries, providing a new tool for surface science.
format Preprint
id arxiv_https___arxiv_org_abs_2412_17528
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle A 3-dimensional scanning trapped-ion probe
Sägesser, Tobias
Jain, Shreyans
Hrmo, Pavel
Ferk, Alexander
Simoni, Matteo
Cui, Yingying
Mordini, Carmelo
Kienzler, Daniel
Home, Jonathan
Quantum Physics
Atomic Physics
Single-atom quantum sensors offer high spatial resolution and high sensitivity to electric and magnetic fields. Among them, trapped ions offer exceptional performance in sensing electric fields, which has been used in particular to probe these in the proximity of metallic surfaces. However, the flexibility of previous work was limited by the use of radio-frequency trapping fields, which has restricted spatial scanning to linear translations, and calls into question whether observed phenomena are connected to the presence of the radio-frequency fields. Here, using a Penning trap instead, we demonstrate a single ion probe which offers three-dimensional position scanning at distances between $50$ $μ\mathrm{m}$ and $450$ $μ\mathrm{m}$ from a metallic surface and above a $200\times200$ $μ\mathrm{m}^{2}$ area, allowing us to reconstruct static and time-varying electric as well as magnetic fields. We use this to map charge distributions on the metallic surface and noise stemming from it. The methods demonstrated here allow similar probing to be carried out on samples with a variety of materials, surface constitutions and geometries, providing a new tool for surface science.
title A 3-dimensional scanning trapped-ion probe
topic Quantum Physics
Atomic Physics
url https://arxiv.org/abs/2412.17528