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Bibliographic Details
Main Authors: Berkels, Benjamin, Binev, Peter
Format: Preprint
Published: 2024
Subjects:
Online Access:https://arxiv.org/abs/2412.17693
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author Berkels, Benjamin
Binev, Peter
author_facet Berkels, Benjamin
Binev, Peter
contents The problem of noise in a general data acquisition procedure can be resolved more accurately if it is based on a model that describes well the distortions of the data including both spatial and intensity changes. The focus of this article is the modeling of the position distortions during sequential data acquisitions. A guiding example is the data obtained by Scanning Transmission Electron Microscopy (STEM) and High Angular Annular Dark Field (HAADF) data, in particular. The article discusses different models of the position noise and their numerical implementations comparing some computational results.
format Preprint
id arxiv_https___arxiv_org_abs_2412_17693
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Joint denoising and line distortion correction for raster-scanned image series
Berkels, Benjamin
Binev, Peter
Numerical Analysis
The problem of noise in a general data acquisition procedure can be resolved more accurately if it is based on a model that describes well the distortions of the data including both spatial and intensity changes. The focus of this article is the modeling of the position distortions during sequential data acquisitions. A guiding example is the data obtained by Scanning Transmission Electron Microscopy (STEM) and High Angular Annular Dark Field (HAADF) data, in particular. The article discusses different models of the position noise and their numerical implementations comparing some computational results.
title Joint denoising and line distortion correction for raster-scanned image series
topic Numerical Analysis
url https://arxiv.org/abs/2412.17693