Detectorless 3D terahertz imaging: achieving subwavelength resolution with reflectance confocal interferometric microscopy
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arXiv
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| Autori principali: | , , , , , , , , , , , , , , , , , , , , |
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| Natura: | Preprint |
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2024
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| author | Silva, Jorge Plöschner, Martin Bertling, Karl Ghantala, Mukund Gillespie, Tim Torniainen, Jari Herbert, Jeremy Lim, Yah Leng Taimre, Thomas Qi, Xiaoqiong Donose, Bogdan C. Zhou, Tao Lui, Hoi-Shun Indjin, Dragan Han, Yingjun Li, Lianhe Valavanis, Alexander Linfield, Edmund H. Davies, A. Giles Dean, Paul Rakić, Aleksandar D. |
| author_facet | Silva, Jorge Plöschner, Martin Bertling, Karl Ghantala, Mukund Gillespie, Tim Torniainen, Jari Herbert, Jeremy Lim, Yah Leng Taimre, Thomas Qi, Xiaoqiong Donose, Bogdan C. Zhou, Tao Lui, Hoi-Shun Indjin, Dragan Han, Yingjun Li, Lianhe Valavanis, Alexander Linfield, Edmund H. Davies, A. Giles Dean, Paul Rakić, Aleksandar D. |
| contents | Terahertz imaging holds great potential for non-destructive material inspection, but practical implementation has been limited by resolution constraints. In this study, we present a single-pixel THz imaging system based on a confocal microscope architecture, utilising a quantum cascade laser as both transmitter and phase-sensitive receiver. Our approach integrates laser feedback interferometry detection to achieve a two-fold improvement in lateral resolution and a two-order-of-magnitude enhancement in axial resolution over conventional imaging through precise interferometric phase measurements. This translates to a lateral resolution near $λ/2$ and a depth of focus better than $λ/5$, significantly outperforming traditional confocal systems. The system can produce a 0.5 Mpixel image in under two minutes, surpassing both raster-scanning single-pixel and multipixel focal-plane array-based imagers. Coherent operation enables simultaneous amplitude and phase image acquisition, and a custom visualisation method links amplitude to image saturation and phase to hue, enhancing material characterisation. A 3D tomographic analysis of a silicon chip reveals subwavelength features, demonstrating the system's potential for high-resolution THz imaging and material analysis. This work sets a new benchmark for THz imaging, overcoming key challenges and opening up transformative possibilities for non-destructive material inspection and characterisation. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2412_18403 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Detectorless 3D terahertz imaging: achieving subwavelength resolution with reflectance confocal interferometric microscopy Silva, Jorge Plöschner, Martin Bertling, Karl Ghantala, Mukund Gillespie, Tim Torniainen, Jari Herbert, Jeremy Lim, Yah Leng Taimre, Thomas Qi, Xiaoqiong Donose, Bogdan C. Zhou, Tao Lui, Hoi-Shun Indjin, Dragan Han, Yingjun Li, Lianhe Valavanis, Alexander Linfield, Edmund H. Davies, A. Giles Dean, Paul Rakić, Aleksandar D. Optics Terahertz imaging holds great potential for non-destructive material inspection, but practical implementation has been limited by resolution constraints. In this study, we present a single-pixel THz imaging system based on a confocal microscope architecture, utilising a quantum cascade laser as both transmitter and phase-sensitive receiver. Our approach integrates laser feedback interferometry detection to achieve a two-fold improvement in lateral resolution and a two-order-of-magnitude enhancement in axial resolution over conventional imaging through precise interferometric phase measurements. This translates to a lateral resolution near $λ/2$ and a depth of focus better than $λ/5$, significantly outperforming traditional confocal systems. The system can produce a 0.5 Mpixel image in under two minutes, surpassing both raster-scanning single-pixel and multipixel focal-plane array-based imagers. Coherent operation enables simultaneous amplitude and phase image acquisition, and a custom visualisation method links amplitude to image saturation and phase to hue, enhancing material characterisation. A 3D tomographic analysis of a silicon chip reveals subwavelength features, demonstrating the system's potential for high-resolution THz imaging and material analysis. This work sets a new benchmark for THz imaging, overcoming key challenges and opening up transformative possibilities for non-destructive material inspection and characterisation. |
| title | Detectorless 3D terahertz imaging: achieving subwavelength resolution with reflectance confocal interferometric microscopy |
| topic | Optics |
| url | https://arxiv.org/abs/2412.18403 |