Few-shot Metric Domain Adaptation: Practical Learning Strategies for an Automated Plant Disease Diagnosis

Fuente: arXiv

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Bibliographic Details
Main Authors:	Kudo, Shoma, Kagiwada, Satoshi, Iyatomi, Hitoshi
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2412.18859