Microscopic imprints of learned solutions in adaptive resistor networks

Fuente: arXiv
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Main Authors: Guzman, Marcel, Martins, Felipe, Stern, Menachem, Liu, Andrea J.
Format: Preprint
Published: 2024
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author Guzman, Marcel
Martins, Felipe
Stern, Menachem
Liu, Andrea J.
author_facet Guzman, Marcel
Martins, Felipe
Stern, Menachem
Liu, Andrea J.
contents In physical networks trained using supervised learning, physical parameters are adjusted to produce desired responses to inputs. An example is electrical contrastive local learning networks of nodes connected by edges that are resistors that adjust their conductances during training. When an edge conductance changes, it upsets the current balance of every node. In response, physics adjusts the node voltages to minimize the dissipated power. Learning in these systems is therefore a coupled double-optimization process, in which the network descends both a cost landscape in the high-dimensional space of edge conductances, and a physical landscape -- the power -- in the high-dimensional space of node voltages. Because of this coupling, the physical landscape of a trained network contains information about the learned task. Here we demonstrate that all the physical information relevant to the trained input-output relation can be captured by a susceptibility, an experimentally measurable quantity. We supplement our theoretical results with simulations to show that the susceptibility is positively correlated with functional importance and that we can extract physical insight into how the system performs the task from the conductances of highly susceptible edges.
format Preprint
id arxiv_https___arxiv_org_abs_2412_19356
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Microscopic imprints of learned solutions in adaptive resistor networks
Guzman, Marcel
Martins, Felipe
Stern, Menachem
Liu, Andrea J.
Disordered Systems and Neural Networks
Soft Condensed Matter
Statistical Mechanics
In physical networks trained using supervised learning, physical parameters are adjusted to produce desired responses to inputs. An example is electrical contrastive local learning networks of nodes connected by edges that are resistors that adjust their conductances during training. When an edge conductance changes, it upsets the current balance of every node. In response, physics adjusts the node voltages to minimize the dissipated power. Learning in these systems is therefore a coupled double-optimization process, in which the network descends both a cost landscape in the high-dimensional space of edge conductances, and a physical landscape -- the power -- in the high-dimensional space of node voltages. Because of this coupling, the physical landscape of a trained network contains information about the learned task. Here we demonstrate that all the physical information relevant to the trained input-output relation can be captured by a susceptibility, an experimentally measurable quantity. We supplement our theoretical results with simulations to show that the susceptibility is positively correlated with functional importance and that we can extract physical insight into how the system performs the task from the conductances of highly susceptible edges.
title Microscopic imprints of learned solutions in adaptive resistor networks
topic Disordered Systems and Neural Networks
Soft Condensed Matter
Statistical Mechanics
url https://arxiv.org/abs/2412.19356