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Emittance Minimization for Aberration Correction I: Aberration correction of an electron microscope without knowing the aberration coefficients

Fuente: arXiv

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Bibliographic Details
Main Authors:	Ma, Desheng, Zeltmann, Steven E., Zhang, Chenyu, Baraissov, Zhaslan, Shao, Yu-Tsun, Duncan, Cameron, Maxson, Jared, Edelen, Auralee, Muller, David A.
Format:	Preprint
Published:	2024
Subjects:	Instrumentation and Detectors Materials Science Accelerator Physics
Online Access:	Acceder al recurso
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